Connect-Tek USB-16 Manual do Utilizador descarregar pdf (Página 5)

Host High Speed Electrical Test Procedure Revision 1.4

1 Introduction

The USB 2.0 Compliance Committee under the direction of USB-IF, Inc develops the USB-IF High-

speed Electrical Test Procedures. There are three High-speed Electrical Test Procedures.

• The Host High-speed Electrical Test Procedure is for EHCI host controllers.

• The Hub High-speed Electrical Test Procedure is for high-speed capable hubs.

• The Device High-speed Electrical Test Procedure is for high-speed capable devices.

The High-speed Electrical Compliance Test Procedures verify the electrical requirements of high-

speed USB operation of these devices designed to the USB 2.0 specification. In addition to passing

the high-speed test requirements, high-speed capable products must also complete and pass the

applicable legacy compliance tests identified in these documents to be posted on the USB-IF

Integrators List and use the USB-IF logo in conjunction with the said product (if the vendor has

signed the USB-IF Trademark License Agreement). These legacy compliance tests are identified in

the Legacy USB Compliance Test section in this document.

This test procedure is an update of the USB-IF Host Electrical High-speed Test Procedure written for

the Tektronix TDS694C and the USB-IF MatLab scripts. This updated procedure is written to

support Tektronix TDS7404/B, CSA7404/B, TDS7704B, TDS7254/B, TDS6604/B, TDS6804/B,

TDS6404, DPO7254, DPO7354 and DPO/DSA70000 series running TDSUSB2 Compliance Test

Application Software. The TDSUSB2 software is used in place of the MatLab scripts and NI GPIB

DAQ software.

2 Purpose

This USB-IF High-speed Electrical Test Procedure documents a series of tests used to evaluate USB

peripherals and systems operating at high speeds. These tests are also used to evaluate the high-speed

operation of USB silicon that has been incorporated in ready-to-ship products, reference designs,

proofs of concept and one-of-a- kind prototype of peripherals, add-in cards, motherboards, or

systems.

This test procedure refers to the test assertions in the USB-IF USB2.0 Electrical Test Specification,

Version 1.3.

This Host USB-IF High-speed Electrical Test Procedure is one of the three USB-IF High-speed

Electrical Compliance Test Procedures. The other two are Hub USB-IF High-speed Electrical Test

Procedure and Device USB-IF High-speed Electrical Test Procedure. The adoption of the individual

procedures based on the device class makes it easier to use.

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