Connect-Tek USB-16 Manual do Utilizador descarregar pdf (Página 27)

Host High Speed Electrical Test Procedure Revision 1.4

4.7 Host CHIRP Timing (EL_33, EL_34, EL_35)

1. Connect the short USB cable dongle of the HS Device SQ segment of the TDSUSBF test

fixture into the upstream facing port of the known good high-speed device. Connect the Init

port of the test fixture to the port under test. Apply power to the device. Ensure that the Test

Init switch is in the Init position.

2. Connect Channel 2 and Channel 3 FET probes to the test fixture at J36. Connect Ch2 to D- and

Ch3 to D+. Connect the probe grounds.

3. Launch the TDSUSB software application on the oscilloscope. For more details, refer to

Starting the application

4. In the applications menu bar select, File> Recall Default Setup.

5. Within the USB2.0 compliance test application, select the High Speed tab.

6. Select Measurement > Select > Chirp on the TDSUSB2 application.

7. Click the Chirp button on the application and select Host option EL_33, EL_34. Click Run.

8. Connect the downstream facing port of the device under test into the TEST port of the test

fixture.

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Connect-Tek USB-16 Manual do Utilizador Página 27