Connect-Tek USB-2 Manual do Utilizador Página 11

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www.tektronix.com/usb 11
Understanding and Performing USB 2.0 Physical Layer Testing and Debugging
Test Fixture
The test fixture is the most crucial component that enables
probing for every test set-up. The ideal test fixture should
provide access to the differential data lines (D+, D-) and V
BUS
and offer access/connections via on-board USB connectors
or wired dongles.
For receiver sensitivity testing, SMA cables are needed to
connect the data generator to data lines to stimulate the
device. Cable access is also needed to allow impedance
measurements by a TDR measurement device.
The TDSUSBF is a comprehensive compliance test fixture to
enable USB 2.0 testing, as shown in Figure 12.
Test Software
A user may choose among fully automatic test software, semi-
automated test software and manual testing.
Fully Automatic Test Software
Fully automatic test software, such as the option USB
compliance test package, substantially improves test efficiency
by providing automatic oscilloscope set-ups, automated
highspeed tests and quick “one-touch” testing. This test
package drastically reduces the test time and chances of any
erroneous measurements.
Semi-Automated Test Software
As the name implies, this kind of solution automates certain
tests but invariably omits certain requirements of compliance
testing, resulting in reduced overall throughput. Examples
of some tests that still need to be manually performed are
high-speed compliance tests such as receiver sensitivity,
CHIRP and monotonicity tests, as well as rise and fall time
calculations.
Manual Testing
The complexity of the tests and setups demand a high level of
expertise from the test engineer. Setting up the oscilloscope
can be a tedious and time consuming task, as oscilloscope
set-ups differ for various test configurations. A user is
compelled to make continuous references to exhaustive
documentation about test procedures, making testing difficult
and significantly reducing efficiency.
Probes
Probes are a critical component of the measurement system
to perform various USB 2.0 compliance tests. Tektronix
offers differential (P6248
*4
, TDP1500, TDP3500), single-
ended (P6245
*4
, TAP1500, TAP2500, TAP3500) and current
(TCP202
*4
, TCP0030) probes that allow access to high-density
boards with fine-pitch, hard-to-reach components while
maintaining maximum signal fidelity.
Figure 12. TDSUSBF Test fixture.
*4
Requires a TPA-BNC adapter when used on an MSO/DPO5000 or DPO7000 Series model.
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